{"id":103,"date":"2026-05-01T16:14:24","date_gmt":"2026-05-01T16:14:24","guid":{"rendered":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/?page_id=103"},"modified":"2026-05-01T16:15:43","modified_gmt":"2026-05-01T16:15:43","slug":"international-conference","status":"publish","type":"page","link":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/publications\/international-conference\/","title":{"rendered":"\u56fd\u969b\u4f1a\u8b70"},"content":{"rendered":"\n
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  1. Shun Yamaguchi, Takashi Hisakado, Osami Wada, and Mahfuzul Islam, \u201cAn Adaptive-Sampling Digital LDO with Statistical Comparator Selection Achieving 99.99% Maximum Current Efficiency and 0.25ps FoM in 65nm,\u201d in IEEE Asian Solid-State Circuits Conference (A-SSCC)<\/em>, to appear.<\/li>\n\n\n\n
  2. Mahfuzul Islam, Shogo Harada, Takashi Hisakado, Osami Wada, \u201cCMOS temperature sensor utilizing gate-length-based threshold voltage modulation,\u201d in 21st IEEE Interregional NEWCAS Conference<\/em>, June 2023, pp. 1-5.<\/li>\n\n\n\n
  3. Raul Roberto Rodriguez Gutierrez, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, \u201cReal-time temperature estimation of SiC MOSFETs using gate voltage at zero-current switching for inverter applications,\u201d in IEEE International Conference on Power Electronics-ECCE Asia<\/em>, May 2023, pp. 1355-1360.<\/li>\n\n\n\n
  4. Yuma Iwata, Takehiro Kitamura, and Mahfuzul Islam, \u201cMeasurement of temperature effect on comparator offset voltage variation,\u201d in IEEE International Conference on Microelectronic Test Structures<\/em>, March 2023, pp. 86-91. [PDF<\/a>] (Best Paper Award<\/strong>)<\/li>\n\n\n\n
  5. Mahfuzul Islam, Takehiro Kitamura, Takashi Hisakado, Osami Wada, \u201cDemonstration of order statistics based Flash ADC in a 65nm process,\u201d in 28th Asia and South Pacific Design Automation Conference<\/em>, January 2023, pp. 188-189.<\/li>\n\n\n\n
  6. Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, Osami Wada, \u201cA fully synchronous digital LDO with built-in adaptive frequency modulation and implicit dead-zone control,\u201d in 28th Asia and South Pacific Design Automation Conference<\/em>, January 2023, pp. 186-187. (Best Design Award<\/strong>)<\/li>\n\n\n\n
  7. Kenta Yamamoto, Takashi Hisakado, Mahfuzul Islam, Osami Wada, \u201cGlobal Stabilization for Nonlinear Two-Port Characteristics of Bidirectional DC\/DC Converter,\u201d NOLTA 2022<\/em>, Opatija, Croatia (Online), December 2022.<\/li>\n\n\n\n
  8. Shinichi Ota, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, \u201cWide temperature- and voltage-range temperature sensing utilizing statistical property of sub-threshold MOSFET current,\u201d in International Conference on Solid State Devices and Materials<\/em>, September 2022, pp. 788-789.<\/li>\n\n\n\n
  9. Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, \u201cPerformance Improvement of Order Statistics Based Flash ADC Using Multiple Comparator Groups,\u201d in IEEE International NEWCAS Conference<\/em>, June 2022, pp. 1-4. (Invited to IEEE-CAS special edition<\/strong>)<\/li>\n\n\n\n
  10. Misaki Udo, Mahfuzul Islam, and Hidetoshi Onodera, \u201cHomogeneous ring oscillator with staggered layout for gate-level delay characterization,\u201d in IEEE International Microelectronic Test Structures (ICMTS)<\/em>, March 2022, pp. 1-6, doi: 10.1109\/ICMTS50340.2022.9898111.<\/li>\n\n\n\n
  11. Shogo Harada, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, \u201cA process scalable voltage-reference-Free temperature sensor utilizing MOSFET threshold voltage variation,\u201d in IEEE Asian Solid-State Circuits Conference (A-SSCC)<\/em>, Nov. 2021, pp. 1-3.<\/li>\n\n\n\n
  12. Mahfuzul Islam, and Shogo Harada, \u201cOn-chip leakage current variation measurement using reference-free current-to-time conversion,\u201d in International Conference on Solid State Devices and Materials<\/em>, Sep. 2021, pp. 694-695.<\/li>\n\n\n\n
  13. Kensuke Murakami, Mahfuzul Islam, and Hidetoshi Onodera, \u201cCDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models,\u201d in 27th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)<\/em>, June 2021, pp. 1-6.<\/li>\n\n\n\n
  14. Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, \u201cFlash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection,\u201d in International Symposium on Quality Electronic Design (ISQED)<\/em>, March 2021, pp. 103-108.<\/li>\n\n\n\n
  15. Teruki Someya, A.K.M. Mahfuzul Islam, and Kenichi Okada, \u201cA 6.4nW 1.7% Relative Inaccuracy CMOS Temperature Sensor Utilizing Sub-thermal Drain Voltage Stabilization and Frequency Locked Loop,\u201d in IEEE Asian Solid-State Circuits Conference (A-SSCC)<\/em>, Hiroshima, Japan, Nov. 2020.<\/li>\n\n\n\n
  16. Masaki Kawamoto, Takashi Hisakado, Mahfuzul Islam, and Osami Wada, \u201cPower Equalization of Peer-to-Peer Energy Transfer in Star Networks Using Broadcast from Reference Voltage Source,\u201d in NOLTA 2020<\/em>, Okinawa, Japan(Online), Nov. 2020.<\/li>\n\n\n\n
  17. Daisuke Akimaru, Takashi Hisakado, Mahfuzul Islam, and Osami Wada, \u201cExcitation of the Light Line Mode with Metamaterials Composed of Parallel Conductors Based On Equivalent-Circuit Model Including Retarded Electromagnetic Coupling,\u201d in 2020 Fourteenth International Congress on Artificial Materials for Novel Wave Phenomena (Metamaterials)<\/em>, New York, USA(Online), Sep. 2020, pp. 291\u2013293.<\/li>\n\n\n\n
  18. Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, and Makoto Takamiya, \u201cPower Device Degradation Estimation by Machine Learning of Gate Waveforms,\u201d in International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)<\/em>, Kobe, Japan, Sep. 2020, pp. 335-338.<\/li>\n\n\n\n
  19. Misaki Udo, Kensuke Murakami, A. K. M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cIncreased Delay Variability due to Random Telegraph Noise under Dynamic Back-gate Tuning,\u201d in IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)<\/em>, May 2020, pp. 1-6.<\/li>\n\n\n\n
  20. Akira Hasegawa, Takashi Hisakado, A.K.M. Mahfuzul Islam, and Osami Wada, \u201cTopological Tuning of a Dispersion Curve by Controlling Locations of Impurities with Equivalent Circuit Model,\u201d in International Congress on Artificial Materials for Novel Wave Phenomena (Metamaterials)<\/em>, pp. 149\u2013151, Rome, Italy, September. 2019. <\/li>\n\n\n\n
  21. Nobuhiko Kawashima, Takashi Hisakado, A.K.M. Mahfuzul Islam, and Osami Wada, \u201cTransients of Gyrator Network of Bidirectional AC\/DC Converters in Peer-to-Peer Energy Transfer,\u201d in International Symposium on Nonlinear Theory and Its Applications (NOLTA)<\/em>, Kuala Lumpur, Malaysia, December 2019, pp. 2-6,. <\/li>\n\n\n\n
  22. K. Miyazaki, Y. Lo, A.K.M. Mahfuzul Islam, K. Hata, M. Takamiya, and T. Sakurai, \u201cCNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring,\u201d in IEEE International Conference on IC Design and Technology (ICICDT)<\/em>, Suzhou, China, June 2019, pp. 104-107.<\/li>\n\n\n\n
  23. A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera, \u201cAnalysis of Random Telegraph Noise (RTN) at Near-threshold Operation by Measuring 154k Ring Oscillators,\u201d in IEEE International Reliability Physics Symposium (IRPS)<\/em>, April 2019, pp. 1-6.<\/li>\n\n\n\n
  24. A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera, \u201cEffect of Logic Depth and Switching Speed on Random Telegraph Noise Induced Delay Fluctuation,\u201d in International Conference on Microelectronic Test Structure (ICMTS)<\/em>, March 2019, pp. 160-170.<\/li>\n\n\n\n
  25. A.K.M. Mahfuzul Islam, Shinichi Nishizawa, Yusuke Matsui, and Yoshinobu Ichida, \u201cDrive-Strength Selection for Synthesis of Leakage-Dominant Circuits,\u201d in International Symposium on Quality Electronic Design (ISQED)<\/em>, March 2019, pp. 298-303.<\/li>\n\n\n\n
  26. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cPVT2<\/sup>: Process, Voltage, Temperature and Time-dependent Variability in Scaled CMOS Process,\u201d in IEEE\/ACM International Conference on Computer-Aided Design<\/em>, November 2018.<\/li>\n\n\n\n
  27. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cWorst-case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability,\u201d in ACM International Symposium on Power and Timing Modeling, Optimization and Simulation<\/em>, July 2018, pp. 140-146. [C_Islam_PATMOS_2018<\/a>]<\/li>\n\n\n\n
  28. Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad, \u201cDU-MD: An Open-Source Human Action Dataset for Ubiquitous Wearable Sensors,\u201d in 7th International Conference on Informatics, Electronics and Vision<\/em>, June 2018, pp. 567-572. (Best paper nominee<\/strong>) [C_Saha_ICIEV_2018<\/a>]<\/li>\n\n\n\n
  29. Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya, \u201cA 13nW Temperature-to-Digital Converter Utilizing Sub-threshold MOSFET Operation at Sub-thermal Drain Voltage,\u201d in Custom Integrated Circuits Conference<\/em>, April 2018, pp. 1-4. (Best paper nominee<\/strong>) [C_Someya_CICC_2018<\/a>]<\/li>\n\n\n\n
  30. A.K.M. Mahfuzul Islam, Masashi Oka, and Hidetoshi Onodera, \u201cMeasurement of Temperature Effect on Random Telegraph Noise Induced Delay Fluctuation,\u201d in International Conference on Microelectronic Test Structure<\/em>, March 2018, pp. 2010-2015. [C_Islam_ICMTS_2015<\/a>]<\/li>\n\n\n\n
  31. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cSupply Voltage Effect on Random Telegraph Noise Induced Delay Variation,\u201d in IEEE\/ACM Workshop on Variability Modeling and Characterization<\/em>, November 2017.<\/li>\n\n\n\n
  32. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cEffect of Supply Voltage on Random Telegraph Noise of Transistors under Switching Condition,\u201d in International Symposium on Power and Timing Modeling, Optimization and Simulation<\/em>, September 2017,  pp. 1-8. [C_Islam_PATMOS_2017<\/a>]<\/li>\n\n\n\n
  33. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, \u201cA Statistical Modeling Methodology of RTN Gate Size Dependency Based on Skewed Ring Oscillators,\u201d IEEE International Conference on Microelectronic Test Structure<\/em>, March 2017, pp. 1-6. (Best paper award<\/strong>) [C_Islam_ICMTS_2017<\/a>]<\/li>\n\n\n\n
  34. A.K.M. Mahfuzul Islam, Hiroshi Fuketa, Koichi Ishida, Tomoyuki Yokota, Tsuyoshi Sekitani, Makoto Takamiya, Takao Someya, and Takayasu Sakurai, \u201cSensor and Circuit Solutions for Organic Flexible Electronics,\u201d in Society for Information Display Symposium Digest of Technical Papers<\/em>, May 2016, pp. 629-632. [C_Islam_SID_2016<\/a>]<\/li>\n\n\n\n
  35. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, \u201cStatistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Variation Measurement,\u201d in IEEE International Conference on Microelectronic Test Structures<\/em>, March 2016, pp. 82-87. [C_Islam_ICMTS_2016<\/a>]<\/li>\n\n\n\n
  36. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cOn-chip Monitoring and Compensation Scheme with Fine-grain Body Biasing for Robust and Energy-Efficient Operations,\u201d in IEEE Asia and South Pacific Design Automation Conference<\/em>, January 2016. pp. 403-407. [C_Islam_ASP-DAC_2016<\/a>]<\/li>\n\n\n\n
  37. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, \u201cCharacterization of Gate Width Dependency on Random Telegraph Noise using Reconfigurable Ring Oscillator for Compact Statistical Modeling,\u201d in IEEE\/ACM Workshop on Variability Modeling and Characterization<\/em>, November 2015.<\/li>\n\n\n\n
  38. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cSensitivity-Independent Extraction of Vth Variation Utilizing Log-normal Delay Distribution,\u201d in IEEE International Conference on Microelectronic Test Structures<\/em>, March 2015. pp. 212-217. [C_Islam_ICMTS_2015<\/a>]<\/li>\n\n\n\n
  39. Norihiro Kamae, A.K.M. Mahfuzul Islam, Akira Tsuchiya, Tohru Ishihara, and Hidetoshi Onodera, \u201cEnergy Reduction by Built-in Body Biasing with Single Supply Voltage Operation,\u201d in 16th International Symposium on Quality Electronic Design<\/em>, March 2015, pp. 181-185. [C_Kamae_ISQED_2015<\/a>]<\/li>\n\n\n\n
  40. A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera, \u201cWide-Supply- Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring,\u201d in IEEE Asian Solid-State Circuits Conference<\/em>, November 2014, pp. 45-48. (Invited to IEEE-JSSC special edition<\/strong>) [C_Islam_A-SSCC_2014<\/a>]<\/li>\n\n\n\n
  41. Norihiro Kamae, A.K.M. Mahfuzul Islam, Akira Tsuchiya, Tohru Ishihara, and Hidetoshi Onodera, \u201cBody Bias Generator with Wide Supply-Range Down to Threshold Voltage for Within-Die Variability Compensation,\u201d in IEEE Asian Solid-State Circuits Conference<\/em>, November 2014, pp. 53-56. [C_Kamae_A-SSCC_2014<\/a>]<\/li>\n\n\n\n
  42. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cCharacterization and Compensation of Performance Variability Using On-chip Monitors,\u201d in IEEE International Symposium on VLSI Design, Automation and Test<\/em>, April 2014. (Invited<\/strong>) [C_Islam_VLSI-DAT_2014<\/a>]<\/li>\n\n\n\n
  43. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cIn-Situ Variability Characterization of Individual Transistors using Topology-Reconfigurable Ring Oscillators,\u201d in IEEE International Conference on Microelectronic Test Structures<\/em>, March 2014, pp. 121-126. [C_Islam_ICMTS_2014<\/a>]<\/li>\n\n\n\n
  44. Norihiro Kamae, A.K.M Mahfuzul Islam, Akira Tsuchiya, and Hidetoshi Onodera, \u201cCell-based Physical Design Automation for Analog and Mixed Signal Application,\u201d in ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems<\/em>, March 2014.<\/li>\n\n\n\n
  45. A.K.M. Mahfuzul Islam, Tohru Ishihara, and Hidetoshi Onodera, \u201cReconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes,\u201d in IEEE Asian Solid-State Circuits Conference<\/em>, November 2013, pp. 125-128. (Student design contest award<\/strong>) (Invited to IEEE-JSSC special edition<\/strong>) [C_Islam_A-SSCC_2013<\/a>]<\/li>\n\n\n\n
  46. A.K.M. Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera, \u201cEnergy-efficient Dynamic Voltage and Frequency Scaling by P\/N-performance Self-adjustment using Adaptive Body Bias,\u201d in Proceedings of SASIMI<\/em>, October 2013.<\/li>\n\n\n\n
  47. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cArea-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations,\u201d in International Conference on Solid State Devices and Materials<\/em>, September 2013, pp. 132-133. [C_Islam_SSDM_2013<\/a>]<\/li>\n\n\n\n
  48. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cOn-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation,\u201d in IEEE Asian Test Symposium<\/em>, 2012, pp. 350-354. [C_Islam_ATS_2012<\/a>]<\/li>\n\n\n\n
  49. A.K.M Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera, \u201cA Built-in Self-adjustment Scheme with Adaptive Body Bias using P\/N-sensitive Digital Monitor Circuits,\u201d in IEEE Asian Solid-State Circuits Conference<\/em>, November 2012, pp. 101-104. [C_Islam_A-SSCC_2012<\/a>]<\/li>\n\n\n\n
  50. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera, \u201cInhomogeneous Ring Oscillator for WID Variability and RTN Characterization,\u201d in IEEE International Conference on Microelectronic Test Structures<\/em>, March 2012, pp. 25-30. (Best paper nominee<\/strong>) (Invited to IEEE-TSM special edition<\/strong>) [C_Fujimoto_ICMTS_2012<\/a>]<\/li>\n\n\n\n
  51. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, \u201cVariation-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variation,\u201d in IEEE International Conference on Microelectronic Test Structures<\/em>, April 2011, pp. 153-157. (Invited to IEEE-TSM special edition<\/strong>) [C_Islam_ICMTS_2011<\/a>]<\/li>\n\n\n\n
  52. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Shinichi Nishizawa, and Hidetoshi Onodera, \u201cExtraction of variability sources from within-die random delay variation,\u201d in IEEE International Workshop on Design for Manufacturability & Yield<\/em>, May 2010. [C_Fujimoto_DFMY_2010<\/a>]<\/li>\n\n\n\n
  53. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, \u201cProcess-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variability,\u201d in ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems<\/em>, March 2010, pp. 83-88.<\/li>\n<\/ol>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":105,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-103","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/103","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/comments?post=103"}],"version-history":[{"count":1,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/103\/revisions"}],"predecessor-version":[{"id":104,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/103\/revisions\/104"}],"up":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/105"}],"wp:attachment":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/media?parent=103"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}