{"id":107,"date":"2026-05-01T16:17:14","date_gmt":"2026-05-01T16:17:14","guid":{"rendered":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/?page_id=107"},"modified":"2026-05-01T16:17:15","modified_gmt":"2026-05-01T16:17:15","slug":"other-publications","status":"publish","type":"page","link":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/publications\/other-publications\/","title":{"rendered":"\u305d\u306e\u4ed6\u306e\u696d\u7e3e"},"content":{"rendered":"\n<h3 id=\"book-chapters\" class=\"wp-block-heading has-black-color has-text-color has-link-color wp-elements-af769a71c309ce865c749c555fd11fc5\">Book Chapters<\/h3>\n\n\n\n<ol class=\"wp-block-list\">\n<li>Kazutoshi Kobayashi, Mahfuzul Islam, Takashi Matsumoto, and Ryo Kishida, Chapter Title: \u201cRandom Telegraph Noise Under Switching Operation,\u201d pp. 285-333, Book Title: \u201cNoise in Nanoscale Semiconductor Devices,\u201d Springer, 2020.<\/li>\n\n\n\n<li>Mahfuzul Islam, and Hidetoshi Onodera, Chapter Title: \u201cMonitor Circuits for Cross-Layer Resiliency,\u201d Book Title: \u201cDependable Embedded Systems,\u201d Springer, 2020.<\/li>\n<\/ol>\n\n\n\n<h3 id=\"patents\" class=\"wp-block-heading has-black-color has-text-color has-link-color wp-elements-72ba0525815dc96e3e24b56e5f5cfc0b\">Patents<\/h3>\n\n\n\n<ol class=\"wp-block-list\">\n<li>Mahfuzul Islam, Takashi Hisakado, and Osami Wada, \u201cAnalog device, method for controlling same, temperature sensor, and analog-element-associated system,\u201d International publication number: 2022180671. [<a href=\"https:\/\/patents.google.com\/patent\/WO2021090860A1\/en\" target=\"_blank\" rel=\"noreferrer noopener\">link<\/a>]<\/li>\n\n\n\n<li>Onodera, Hidetoshi, and Islam AKM Mahfuzul, \u201cReconfigurable delay circuit, delay monitor circuit using said delay circuit, variation compensation circuit, variation measurement method, and variation compensation method.\u201d Publication No. US2016\/0211836 A1.<\/li>\n\n\n\n<li>A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, \u201cDelay Circuits for Delay Monitor Circuits and Delay Monitor Circuits for signal-propagation-time measurements in integrated circuits,\u201d Japan Patent number: 6297575.<\/li>\n<\/ol>\n\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Book Chapters Patents<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":105,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-107","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/107","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/comments?post=107"}],"version-history":[{"count":1,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/107\/revisions"}],"predecessor-version":[{"id":108,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/107\/revisions\/108"}],"up":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/105"}],"wp:attachment":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/media?parent=107"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}