{"id":99,"date":"2026-05-01T16:11:42","date_gmt":"2026-05-01T16:11:42","guid":{"rendered":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/?page_id=99"},"modified":"2026-05-17T03:20:55","modified_gmt":"2026-05-17T03:20:55","slug":"%e5%8f%97%e8%b3%9e","status":"publish","type":"page","link":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/%e5%8f%97%e8%b3%9e\/","title":{"rendered":"\u53d7\u8cde"},"content":{"rendered":"\n<div style=\"height:15px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading has-black-color has-text-color has-link-color wp-elements-649f2a357dd6afd37fb3b1f02a81db44\" id=\"student-award\">\u5b66\u751f\u306b\u3088\u308b\u53d7\u8cde<\/h3>\n\n\n\n<ol class=\"wp-block-list\">\n<li><strong>Academic Research Award<\/strong>, IEEE CEDA All Japan Joint Chapter, August 2023.\n<ul class=\"wp-block-list\">\n<li>Shun Yamaguchi<\/li>\n\n\n\n<li>Paper: Low-Power design of digital LDO With Adaptive Frequency Scaling Based on MOSFET Subthreshold Current<\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IPSJ Computer Science Research Award for Young Scientists (\u60c5\u5831\u51e6\u7406\u5b66\u4f1a\u30b3\u30f3\u30d4\u30e5\u30fc\u30bf\u30b5\u30a4\u30a8\u30f3\u30b9\u9818\u57df\u5968\u52b1\u8cde)<\/strong>, August 2023.\n<ul class=\"wp-block-list\">\n<li>\u5c71\u53e3 \u99ff<\/li>\n\n\n\n<li>\u8ad6\u6587\uff1aMOSFET\u306e\u30b5\u30d6\u30b9\u30ec\u30c3\u30b7\u30e7\u30eb\u30c9\u96fb\u6d41\u3092\u5229\u7528\u3057\u305f\u9069\u5fdc\u7684\u5468\u6ce2\u6570\u30b9\u30b1\u30fc\u30ea\u30f3\u30b0\u306b\u3088\u308b\u30c7\u30a3\u30b8\u30bf\u30ebLDO\u306e\u4f4e\u6d88\u8cbb\u96fb\u529b\u8a2d\u8a08<\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>SLDM\u7814\u7a76\u4f1a \u512a\u79c0\u8ad6\u6587\u8cde<\/strong>, \u60c5\u5831\u51e6\u7406\u5b66\u4f1a, 2023\u5e748\u6708\n<ul class=\"wp-block-list\">\n<li>\u592a\u7530 \u65b0\u4e00<\/li>\n\n\n\n<li>\u8ad6\u6587\uff1aMOSFET\u306e\u5f31\u53cd\u8ee2\u9818\u57df\u96fb\u6d41\u306e\u7d71\u8a08\u7684\u6027\u8cea\u3092\u5229\u7528\u3057\u305f\u6e29\u5ea6\u30bb\u30f3\u30b7\u30f3\u30b0\u624b\u6cd5<\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>Best Paper Award<\/strong>, 35th IEEE International Conference on Microelectronic Test Structures, March 2023\n<ul class=\"wp-block-list\">\n<li>Yuma Iwata<\/li>\n\n\n\n<li>Paper:&nbsp;<em>Measurement of temperature effect on comparator offset voltage variation<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>Best Design Award<\/strong>,&nbsp;<a href=\"https:\/\/www.aspdac.com\/aspdac2023\/\">ASP-DAC University Design Contest<\/a>, January 2023\n<ul class=\"wp-block-list\">\n<li>Shun Yamaguchi<\/li>\n\n\n\n<li>Paper:&nbsp;<em>A fully synchronous digital LDO with built-in adaptive frequency modulation and implicit dead-zone control<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li>\u60c5\u5831\u51e6\u7406\u5b66\u4f1aSLDM\u7814\u7a76\u4f1a\u512a\u79c0\u767a\u8868\u8cde\uff0cDA\u30b7\u30f3\u30dd\u30b8\u30a6\u30e02022\n<ul class=\"wp-block-list\">\n<li>\u592a\u7530 \u614e\u4e00<\/li>\n\n\n\n<li>\u30bf\u30a4\u30c8\u30eb\uff1a<em>MOSFET\u306e\u5f31\u53cd\u8ee2\u9818\u57df\u96fb\u6d41\u306e\u7d71\u8a08\u7684\u6027\u8cea\u3092\u5229\u7528\u3059\u308b\u6e29\u5ea6\u30bb\u30f3\u30b7\u30f3\u30b0\u624b\u6cd5<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li>\u60c5\u5831\u51e6\u7406\u5b66\u4f1aSLDM\u7814\u7a76\u4f1a\u30bb\u30c3\u30b7\u30e7\u30f3\u7279\u5225\u8cde\uff0cDA\u30b7\u30f3\u30dd\u30b8\u30a6\u30e02022\n<ul class=\"wp-block-list\">\n<li>\u5c71\u53e3\u99ff<\/li>\n\n\n\n<li>\u30bf\u30a4\u30c8\u30eb\uff1a<em>MOSFET\u306e\u30b5\u30d6\u30b9\u30ec\u30c3\u30b7\u30e7\u30eb\u30c9\u96fb\u6d41\u3092\u5229\u7528\u3057\u305f\u9069\u5fdc\u7684\u5468\u6ce2\u6570\u5909\u8abf\u306b\u3088\u308b\u30c7\u30a3\u30b8\u30bf\u30ebLDO\u306e\u4f4e\u6d88\u8cbb\u96fb\u529b\u8a2d\u8a08<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li>\u60c5\u5831\u51e6\u7406\u5b66\u4f1aSLDM\u7814\u7a76\u4f1a\u512a\u79c0\u767a\u8868\u8cde\uff0cDA\u30b7\u30f3\u30dd\u30b8\u30a6\u30e02022\n<ul class=\"wp-block-list\">\n<li>\u5c71\u53e3\u99ff<\/li>\n\n\n\n<li>\u30bf\u30a4\u30c8\u30eb\uff1a<em>MOSFET\u306e\u30b5\u30d6\u30b9\u30ec\u30c3\u30b7\u30e7\u30eb\u30c9\u96fb\u6d41\u3092\u5229\u7528\u3057\u305f\u9069\u5fdc\u7684\u5468\u6ce2\u6570\u5909\u8abf\u306b\u3088\u308b\u30c7\u30a3\u30b8\u30bf\u30ebLDO\u306e\u4f4e\u6d88\u8cbb\u96fb\u529b\u8a2d\u8a08<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>VDEC<\/strong>\u30c7\u30b6\u30a4\u30f3\u30b3\u30f3\u30c6\u30b9\u30c8\u5968\u52b1\u8cde\n<ul class=\"wp-block-list\">\n<li>\u5c71\u53e3\u99ff<\/li>\n\n\n\n<li>\u30bf\u30a4\u30c8\u30eb\uff1a<em>\u30b5\u30d6\u30b9\u30ec\u30c3\u30b7\u30e7\u30eb\u30c9\u96fb\u6d41\u3092\u5229\u7528\u3057\u305f\u5468\u6ce2\u6570\u5909\u8abf\u56de\u8def\u3068 \u5358\u4e00\u53c2\u7167\u96fb\u5727\u3092\u7528\u3044\u305f Dead-zone \u5236\u5fa1\u3092\u642d\u8f09\u3057\u305f\u30c7\u30a3\u30b8\u30bf\u30ebLDO<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><a href=\"https:\/\/www.ipsj.or.jp\/award\/cs-awardee-2022.html\" target=\"_blank\" rel=\"noreferrer noopener\">IPSJ Computer Science Research Award for Young Scientists<\/a>&nbsp;(\u60c5\u5831\u51e6\u7406\u5b66\u4f1a\u30b3\u30f3\u30d4\u30e5\u30fc\u30bf\u30b5\u30a4\u30a8\u30f3\u30b9\u9818\u57df\u5968\u52b1\u8cde), 2022\n<ul class=\"wp-block-list\">\n<li>\u6709\u50cd\u5cac<\/li>\n\n\n\n<li>\u8ad6\u6587\u30bf\u30a4\u30c8\u30eb\uff1a<em>\u9045\u5ef6\u3070\u3089\u3064\u304d\u8a55\u4fa1\u306b\u5411\u3051\u305f\u4ea4\u4e92\u914d\u7f6e\u5747\u8cea\u30ea\u30f3\u30b0\u30aa\u30b7\u30ec\u30fc\u30bf<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li>\u60c5\u5831\u51e6\u7406\u5b66\u4f1aSLDM\u7814\u7a76\u4f1a\u512a\u79c0\u767a\u8868\u8cde\uff0cDA\u30b7\u30f3\u30dd\u30b8\u30a6\u30e02021\n<ul class=\"wp-block-list\">\n<li>\u6709\u50cd\u5cac<\/li>\n\n\n\n<li>\u8ad6\u6587\u30bf\u30a4\u30c8\u30eb\uff1a<em>\u9045\u5ef6\u3070\u3089\u3064\u304d\u8a55\u4fa1\u306b\u5411\u3051\u305f\u4ea4\u4e92\u914d\u7f6e\u5747\u8cea\u30ea\u30f3\u30b0\u30aa\u30b7\u30ec\u30fc\u30bf<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><a href=\"http:\/\/www.sig-sldm.org\/presentation-award.html\">\u60c5\u5831\u51e6\u7406\u5b66\u4f1aSLDM\u7814\u7a76\u4f1a\u30bb\u30c3\u30b7\u30e7\u30f3\u7279\u5225\u8cde<\/a>\uff0c2021\n<ul class=\"wp-block-list\">\n<li>\u539f\u7530\u5f70\u543e<\/li>\n\n\n\n<li>\u8ad6\u6587\u30bf\u30a4\u30c8\u30eb\uff1a<em>\u3057\u304d\u3044\u5024\u96fb\u5727\u5dee\u3092\u5229\u7528\u3057\u305f\u6642\u9593\u9818\u57df\u51e6\u7406\u306b\u3088\u308b\u5e83\u3044\u96fb\u6e90\u96fb\u5727\u3067\u52d5\u4f5c\u3059\u308bCMOS\u6e29\u5ea6\u30bb\u30f3\u30b5<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><a href=\"http:\/\/www.sig-sldm.org\/presentation-award.html\">\u60c5\u5831\u51e6\u7406\u5b66\u4f1aSLDM\u7814\u7a76\u4f1a\u30bb\u30c3\u30b7\u30e7\u30f3\u7279\u5225\u8cde<\/a>\uff0c2021\n<ul class=\"wp-block-list\">\n<li>\u6709\u50cd\u5cac<\/li>\n\n\n\n<li>\u8ad6\u6587\u30bf\u30a4\u30c8\u30eb\uff1a<em>\u96fb\u6e90\u96fb\u5727\u3068\u57fa\u677f\u96fb\u5727\u306e\u52d5\u7684\u8abf\u6574\u304c\u30e9\u30f3\u30c0\u30e0\u30c6\u30ec\u30b0\u30e9\u30d5\u306b\u8d77\u56e0\u3059\u308b\u9045\u5ef6\u3070\u3089\u3064\u304d\u306b\u53ca\u307c\u3059\u5f71\u97ff<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><a href=\"https:\/\/site.ieee.org\/jc-ceda\/awards\/ieee-ceda-all-japan-joint-chapter-best-student-award\/\" target=\"_blank\" rel=\"noreferrer noopener\">IEEE CEDA All Japan Joint Chapter Academic Research Award<\/a>, 2020\n<ul class=\"wp-block-list\">\n<li><em>Shogo Harada<\/em><\/li>\n\n\n\n<li>Paper title:&nbsp;<em>Design of reference-free CMOS temperature sensor with statistical MOSFET selection<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><a href=\"https:\/\/www.ipsj.or.jp\/award\/yamashita2020.html\" target=\"_blank\" rel=\"noreferrer noopener\">IPSJ Yamashita SIG Research Award<\/a>, 2020\n<ul class=\"wp-block-list\">\n<li><em>Shogo Harada<\/em><\/li>\n\n\n\n<li>Paper title:&nbsp;<em>MOSFET\u306e\u7d71\u8a08\u7684\u9078\u629e\u306b\u3088\u308b\u30ec\u30d5\u30a1\u30ec\u30f3\u30b9\u4e0d\u8981\u306aCMOS\u6e29\u5ea6\u30bb\u30f3\u30b5\u306e\u8a2d\u8a08<\/em><\/li>\n<\/ul>\n<\/li>\n<\/ol>\n\n\n\n<h3 class=\"wp-block-heading has-black-color has-text-color has-link-color wp-elements-285fb5537ebe563563f874b5d0a0b2cf\" id=\"faculty-award\">\u6559\u54e1\u306b\u3088\u308b\u53d7\u8cde<\/h3>\n\n\n\n<ol class=\"wp-block-list\">\n<li><strong>Outstanding Faculty Award<\/strong>, 2016, 2017\n<ul class=\"wp-block-list\">\n<li>Institute of Industrial Science, The University of Tokyo<\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IEEE International Conference on Microelectronic Test Structure Best Paper Award<\/strong>, March 2017\n<ul class=\"wp-block-list\">\n<li>Paper:&nbsp;<em>A statistical modeling methodology of RTN gate size dependency based on skewed ring oscillators<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IPSJ Yamashita SIG Research Award<\/strong>, August 2015\n<ul class=\"wp-block-list\">\n<li>Paper title:&nbsp;<em>Transistor-by-Transistor Characterization of Static and Dynamic Variations Using Topology-reconfigurable Monitor Circuit<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>JSPS Postdoctoral Fellowship for Overseas Researchers<\/strong>, 2015\n<ul class=\"wp-block-list\">\n<li>Japan Society for the Promotion of Science<\/li>\n\n\n\n<li>Withdrawn for position in the University of Tokyo<\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IPSJ Computer Science Research Award for Young Scientists<\/strong>, August 2014<\/li>\n\n\n\n<li><strong>IPSJ Student Presentation Award<\/strong>, August 2014<\/li>\n\n\n\n<li><strong>Yasujiro Niwa Outstanding Paper Award<\/strong>, February 2014\n<ul class=\"wp-block-list\">\n<li>Tokyo Denki University<\/li>\n\n\n\n<li>Paper title:&nbsp;<em>Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IEEE Asian Solid-State Circuits Conference Student Design Contest Award<\/strong>, November 2013\n<ul class=\"wp-block-list\">\n<li>Paper title:&nbsp;<em>Reconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IPSJ Outstanding Paper Award<\/strong>, August 2013\n<ul class=\"wp-block-list\">\n<li>Paper title:&nbsp;<em>An All-digital Built-in Self-adjustment Circuit for P\/N-variation Compensation<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IPSJ Student Presentation Award<\/strong>, August 2013\n<ul class=\"wp-block-list\">\n<li>Information Processing Society of Japan<\/li>\n\n\n\n<li>Paper:&nbsp;<em>An All-digital Built-in Self-adjustment Circuit for P\/N-variation Compensation<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>JSPS Research Fellowship for Young Scientists<\/strong>, April 2013<\/li>\n\n\n\n<li><strong>VDEC Design Award<\/strong>, August 2012\n<ul class=\"wp-block-list\">\n<li>VLSI Design and Education Center, Tokyo<\/li>\n\n\n\n<li>For designing a chip with a built-in self-adjustment technique<\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>IEEE Kansai Section Student Research Award<\/strong>, December 2011\n<ul class=\"wp-block-list\">\n<li>Paper title:&nbsp;<em>Variation-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variation<\/em><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>Hatayama Memorial Award<\/strong>, March 2007\n<ul class=\"wp-block-list\">\n<li>The Japan Society of Mechanical Engineers<\/li>\n\n\n\n<li>For excellent results obtained at Oita National College of Technology<\/li>\n<\/ul>\n<\/li>\n<\/ol>\n","protected":false},"excerpt":{"rendered":"<p>\u5b66\u751f\u306b\u3088\u308b\u53d7\u8cde \u6559\u54e1\u306b\u3088\u308b\u53d7\u8cde<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-99","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/99","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/comments?post=99"}],"version-history":[{"count":7,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/99\/revisions"}],"predecessor-version":[{"id":182,"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/pages\/99\/revisions\/182"}],"wp:attachment":[{"href":"https:\/\/www.cas.ict.eng.isct.ac.jp\/jp\/wp-json\/wp\/v2\/media?parent=99"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}