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論文誌

  1. Takehiro Kitamura, Takashi Hisakado, Osami Wada, and Mahfuzul Islam, “Design of Reference-free Flash ADC With On-chip Rank-based Comparator Selection Using Multiple Comparator Groups,” IPSJ Transactions on System LSI Design Methodology, vol. 17, pp. 1-6, 2024.
  2. Daiki Tashiro, Kana Sameshima, Takashi Hisakado, A. K. M. Mahfuzul Islam, and Osami Wada, “Single-conductor transmission line model for bent wire structures,” IEEE Transactions on Electromagnetic Compatibility, vol. 65, no. 5, pp. 1432-1445, 2023. (DOI: 10.1109/TEMC.2023.3290844)
  3. Shinichi Oota, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Wide-range and low supply dependency MOSFET-based temperature sensing utilizing statistical properties of scaled MOSFETs,” Japanese Journal of Applied Physics, vol. 62, no. SC, pp. SC1098, 2023. (DOI: 10.35848/1347-4065/acb94e)
  4. Kenta Yamamoto, Takashi Hisakado, Mahfuzul Islam, and Osami Wada, “Global stabilization for nonlinear two-port characteristics of bidirectional DC/DC converter and its application to peer-to-peer energy transfer,” Nonlinear Theory and Its Applications, IEICE, Volume 14, Issue 2, Pages 292-307, 2023.
  5. Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Low-power design of digital LDO with non-linear symmetric frequency generation,” IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 69, no. 12, pp. 4644-4648, Dec. 2022. (DOI: 10.1109/TCSII.2022.3184774) [PDF]
  6. Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Order statistics based low-power flash ADC with on-chip comparator selection,” IEICE Transactions on Fundamentals, Vol. E105-A, No. 11, pp. 1450-1457, Nov. 2022. [PDF]
  7. Mahfuzul Islam, and Shogo Harada, “On-chip leakage current variation measurement using external-reference-free current-to-time conversion for densely placed MOSFETs,” Japanese Journal of Applied Physics, vol. 61, pp. SC1056, 2022. [PDF]
  8. Teruki Someya, A.K.M. Mahfuzul Islam, and Kenichi Okada, “A 6.4 nW 1.7% Relative Inaccuracy CMOS Temperature Sensor Utilizing Sub-thermal Drain Voltage Stabilization and Frequency Locked Loop,” IEEE Solid-State Circuits Letter, vol. 3, pp. 458-461, 2020. [PDF]
  9. Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya, “An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage,” IEEE Journal of Solid-State Circuits, vol. 54, no. 3, pp. 613-622, March 2019. [PDF]
  10. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation.” IPSJ Transactions on System LSI Design Methodology, vol. 12, pp. 2-12, 2019. [PDF]
  11. Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, Tarek Bin Zahid, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad, “Feature Extraction, Performance Analysis and System Design using the DU Mobility Dataset,” IEEE Access, vol. 6, pp. 44776-44786, 2018. [PDF]
  12. A. K. M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, “Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement,” IEEE Transactions on Semiconductor Manufacturing, vol. 30, no. 3, pp. 216-226, 2017. [PDF]
  13. A. K. M. Mahfuzul Islam, M. Hamamatsu, T. Yokota, S. Lee, W. Yukita, M. Takamiya, T. Someya, and T. Sakurai, “Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors,” IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol. 7, no. 1, pp. 81-91, March 2017. [PDF]
  14. A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera, “Wide-Supply-Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring,” IEEE Journal of Solid-State Circuits, vol. 50, no. 11, pp. 2475-2490, 2015. [PDF]
  15. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations,” Japanese Journal of Applied Physics, vol. 53, no. 4S, pp. 04EE08, 2014. [PDF]
  16. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation,” IEICE Transactions on Information and Systems, vol. E96-D, no. 9, pp. 1971-1979, 2013. [PDF]
  17. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera, “Inhomogeneous Ring Oscillator for Within-Die Variability and RTN Characterization,” IEEE Transactions on Semiconductor Manufacturing, vol. 26, no. 3, pp. 296-305, 2013. [PDF]
  18. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, “Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation,” IEEE Transactions on Semiconductor Manufacturing, vol. 25, no. 4, pp. 571-580, 2012. [PDF]